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The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing.
High frequency (100 kHz or 1 MHz) C-V measurements are commonly applied to test p-n or schottky junction and tal-Insulator-Semiconductor (MIS) devices for device characterization and process control. C-V results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.
Model No
590
Condition
Used
Manufacturer
Keithley
5901
100 kHz Output
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