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Allows for a full verification of an R&S VNA measurement performance, and proof of VNA measurement uncertainty. Verification standards: Offset Short (f and m), Mismatch (f and m), Attenuator (f-m), Stepped Through (f-m). Individual characterization data included.
*The image is for reference only. See product specifications for details.
Model No
ZV-Z429
Condition
New
Manufacturer
Rohde & Schwarz
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