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FPL1-K40 Rohde & Schwarz NEW

FPL1-K40 Rohde & Schwarz NEW

$7,465
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Features:

  • Enables the R&S FPL1000 to perform fast and easy phase noise measurements in development and production
  • With this FLP1-K40, the FPL1000 can measure single sideband phase noise across a selectable carrier offset frequency range displayed on a logarithmic axis
  • Based on the measured phase noise, the user can determine the residual FM/φM and the jitter
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Phase noise is an important parameter in wireless communications systems. The R&S FPL1-K40 option enables the R&S FPL1000 to perform fast and easy phase noise measurements in development and production.

Equipped with the R&S FPL1-K40 option, the R&S FPL1000 can measure single-sideband phase noise across a selectable carrier offset frequency range displayed on a logarithmic axis. Based on the measured phase noise, the user can determine the residual FM/φM and the jitter.

Phase noise measurement
  • Carrier offset frequency range selectable from 1 Hz to 1 GHz in 1/3/10 sequence (1 Hz, 3 Hz, 10 Hz, 30 Hz, etc.)
  • Number of averages, sweep mode and filter bandwidth can be individually selected for every measurement subrange to optimize the measurement speed
  • Fast results for the subranges are obtained by starting the measurement at the maximum carrier offset
  • Verification of carrier frequency and power prior to each measurement to prevent incorrect measurements
  • Improvement of dynamic range by measuring the inherent thermal noise and performing noise correction
Measurement of residual FM/φM and jitter
  • Integration across the entire selected carrier offset frequency range or across a selectable subrange
  • Tabular display of residual FM, residual φM, and RMS jitter in addition to measurement trace

*The image is for reference only. See product specification for details.

Model No

FPL1-K40

Condition

New

Manufacturer

Rohde & Schwarz

Rohde Schwarz FPL1K40 Data Sheet
Rohde Schwarz FPL1000 Signal Spectrum Analyzer Brochure
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