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The Anritsu MS9740A is a bench-top optical spectrum analyzer covering 600 nm to 1750 nm, designed for evaluation of active optical devices including LD modules, DFB-LDs, FP-LDs, LEDs, optical amplifiers, WDM signals, and optical bandpass filters. The instrument combines high-speed waveform sweeping with eight integrated analysis menus to support both production-line throughput and engineering characterization workflows.
Anritsu positions the MS9740A for evaluation of active optical devices such as SFP, XFP, and SFP+ transceiver modules, as well as VCSEL and DFB optical sources. The datasheet also identifies applications in WDM signal evaluation at 100 GHz and 50 GHz channel spacing, EDFA gain and noise figure characterization, PMD measurement of optical fiber, and analysis of optical bandpass filters including WSS and WDM filter devices. Combined with a Bit Error Rate Tester, the analyzer supports spectrum analysis of optical transceiver outputs and WDM signals.
Anritsu Corporation is a Japanese precision measurement company with roots stretching to 1895. Anritsu's optical and RF test portfolio was significantly expanded by its 1993 acquisition of Wiltron Company, which added RF and microwave measurement technology and North American commercial presence to the Anritsu lineup.
| Parameter | Specification |
|---|---|
| Supported Optical Fiber | SM fiber (ITU-T G.652), 50 µm/125 µm GI fiber, PC Connector (reflection attenuation 40 dB or more) |
| Optical Connector | User replaceable: FC, SC, ST, DIN (All connectors are PC polished.) |
| Wavelength Measurement Range | 600 nm to 1750 nm |
| Wavelength Accuracy | ±20 pm (1520 nm to 1620 nm, Resolution: 0.03 nm to 0.2 nm), ±100 pm (1520 nm to 1620 nm, Resolution: 0.5 nm, 1.0 nm); ±300 pm (600 nm to 1520 nm), ±200 pm (1520 nm to 1570 nm), ±300 pm (1570 nm to 1750 nm) |
| Wavelength Stability | ±5 pm (1 min, smoothing: 11 pt, at center wavelength of half maximum, Using SM fiber) |
| Wavelength Linearity | ±20 pm (1520 nm to 1620 nm) |
| Setting Resolution | 0.03, 0.05, 0.07, 0.1, 0.2, 0.5, 1.0 nm (0.03 nm, 0.05 nm only 1550 nm band and room temperature) |
| Resolution Accuracy | ±7% (Resolution: 0.1 nm), ±3% (Resolution: 0.2 nm), ±2.2% (Resolution: 0.5 nm) [1520 nm to 1620 nm]; ±30% (Resolution: 0.1 nm), ±15% (Resolution: 0.2 nm), ±7% (Resolution: 0.5 nm) [600 nm to 1520 nm, 1620 nm to 1750 nm] |
| Measurement Range (5° to 30°C, Optical Att: Off) | -65 to +10 dBm (600-1000 nm), -85 to +10 dBm (1000-1250 nm), -90 to +10 dBm (1250-1600 nm), -85 to +10 dBm (1600-1650 nm), -65 to +10 dBm (1650-1700 nm), -55 to +10 dBm (1700-1750 nm) |
| Measurement Range (30° to 45°C, Optical Att: Off) | -60 to +10 dBm (600-1000 nm), -80 to +10 dBm (1000-1250 nm), -85 to +10 dBm (1250-1600 nm), -80 to +10 dBm (1600-1650 nm), -60 to +10 dBm (1650-1700 nm), -50 to +10 dBm (1700-1750 nm) |
| Measurement Range (Optical Att: On) | -70 to +23 dBm (1100-1600 nm) [5° to 30°C]; -65 to +23 dBm (1100-1600 nm) [30° to 45°C] |
| Level Accuracy | ±0.4 dB (Wavelength: 1310 nm, 1550 nm, Input: -10 dBm, Resolution: 0.1 nm to 1.0 nm) |
| Level Stability | ±0.02 dB (1 min, Wavelength: 1550 nm, Input: -23 dBm, Resolution: 0.1 nm to 1.0 nm, no polarization fluctuation) |
| Level Linearity | ±0.05 dB (Wavelength: 1550 nm, Input: -50 to 0 dBm, Optical Att: Off); ±0.05 dB (Wavelength: 1550 nm, Input: -30 to +20 dBm, Optical Att: On) |
| Level Flatness | ±0.1 dB (Wavelength: 1520 nm to 1620 nm, Resolution: 0.5 nm, Optical Att: Off) |
| Polarization Dependency | ±0.05 dB (Wavelength: 1550 nm/1600 nm), ±0.1 dB (Wavelength: 1310 nm), [Resolution: 0.5 nm, 1.0 nm] |
| Dynamic Range | High dynamic range: 70 dB (1 nm from peak), 60 dB (0.4 nm from peak), 42 dB (0.2 nm from peak); Normal dynamic range: 62 dB (1 nm from peak), 58 dB (0.4 nm from peak), 42 dB (0.2 nm from peak) [Wavelength: 1550 nm, Resolution: 0.05 nm, Optical Att: Off, 20° to 30°C] |
| Optical Return Loss | ≥35 dB (Using SM fiber with wavelength of 1300 nm and 1550 nm) |
| Sweep Width | 0.2 nm to 1200 nm, 0 nm |
| Sweep Speed | ≤0.2 s (span: 5 nm, Resolution: 0.1 nm), ≤0.3 s (span: 500 nm) [VBW: 10 kHz, Normal dynamic range, sweep start to stop, no optical input, sampling point: ≤501] |
| Display | 800 × 600 dots, 8.4 inch SVGA color LCD |
| Measurement Functions | Auto Measure, Optical pulse measurement (External trigger), Power monitor |
| Display Functions | Normalized, Max Hold, Min Hold, Overlap, Value in Air/Vacuum, Effective Resolution, Multi fiber mode |
| Analysis Functions | Wavelength Subtraction, Marker, Wavelength Analysis (Threshold, ndB-Loss, Envelope, RMS, SMSR, Spectrum Power), Light Source Evaluation (FP-LD, DFB-LD, LED, LD Module), Optical AMP NF Evaluation, PMD Measurement, WDM Signal Evaluation, WDM Filter Analysis |
| Calibration Functions | Auto Align, Wavelength cal., Level offset, Wavelength offset |
| Memory Function | Display measurement data to memory A to J (10 waveforms) |
| Interfaces | Ethernet, GPIB (Option) |
| Input/Output | I/O: Save and read files to USB memory; Input: External trigger terminal (0 to 0.8 V / 2 V to 5 V, high impedance); Output: Measured data text file output, measurement screen file (BMP, PNG) output, VGA output |
| Operating Temperature | +5° to +45°C |
| Storage Temperature | -20° to +60°C |
| Relative Humidity | 0 to 90% (no condensation) |
| Power Supply | 100 V(ac) to 120 V(ac) / 200 V(ac) to 240 V(ac), 50 Hz to 60 Hz, ≤75 VA |
| Dimensions | 426 (W) × 177 (H) × 350 (D) mm (excluding projections) |
| Mass | ≤15.0 kg (without options) |
| CE - EMC | 2014/30/EU, EN61326-1, EN61000-3-2 |
| CE - LVD | 2014/35/EU, EN61010-1 |
| CE - RoHS | 2011/65/EU, EN50581 |
| Remote Control Interfaces | Ethernet, GPIB (Opt-001) |
Please review the Manufacturer's Data Sheet to verify published specifications. Feedback on this webpage is always welcome — please reach out to your Test Architect at any time for questions or concerns. Thank you, we truly appreciate you being our customer.
Model No
Anritsu
Condition
Used
Manufacturer
Anritsu
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