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590 Keithley Analyzer Used

590 Keithley Analyzer Used

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Additional Features:

  • 0.1fF sensitivity to test small devices.
  • Ranges up to 20nF (at 100 kHz, using 5904 adapter) to test large, leaky, or forward biased devices.
  • Test signal voltage of 15mV RMS.
  • Choice of 1 MHz frequency for compliance with existing test standards or 100 kHz for improved resolution, range, and accuracy.
  • Selectable measurement rate (1 to 1000 readings per second) and filter to optimize speed/resolution trade-offs.
  • Sophisticated correction for transmission line errors due to device connections.
  • Built-in test setup and correction value storage, analysis, and plotter control to minimize computer programming
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The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing.

High frequency (100 kHz or 1 MHz) C-V measurements are commonly applied to test p-n or schottky junction and  tal-Insulator-Semiconductor (MIS) devices for device characterization and process control. C-V results are highly  correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.

Model No

590

Condition

Used

Manufacturer

Keithley

5901

100 kHz Output

Keithley_590
Keithley_590_Instruction_Manual
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