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The TDS7154 oscilloscopes are high performance solutions for verification, debug, and characterization of sophisticated electronic designs. Classic analog-style controls, a large touch-sensitive display and graphical menus provide intuitive control. Open access to the MS Windows operating system enables unprecedented customization and extensibility.
Superior Performance
TDS7000 models range from 500 MHz to 4 GHz bandwidth with single-shot sample rates to 20 GS/s, meeting demands of the latest high speed logic families and multi-Gigabit communication standards. Acquisition memory options from 2 to 32 Megasamples maximize the value of high sample rate and ensure that critical events are captured with fine detail.
High performance jitter analysis to 1 psRMS is achieved through exceptional trigger and acquisition performance, deep memory and applied software.
TDS7000 Series high bandwidth signal access solutions include the P7240 4 GHz (120 ps rise time) active probe and the P7330 3 GHz (< 130 ps rise time, typical, < 140 ps guaranteed) differential probe. Small form- factors and a wide array of tip accessories ensure effectiveness. In addition, the TDS7404 includes the TekConnect™ signal interconnect system. This interface replaces traditional BNC input connectors with a convenient positivelocking interface suitable for higher system bandwidths. P7000 Series probes are directly compatible with TekConnect signal interconnect system along with adapters that provide SMA, BNC and N connections.
The image is a representation of selection. See specifications for product details.
Model No
TDS7154
Condition
Used
Manufacturer
Tektronix
Channels
4
Frequency
1.5 GHz
Record length
400 kPts
Sampling rate
20 GS/s
1M
2 Msamples max , 500 ksamples/ch
2M
8 Msamples max , 2 Msamples/ch
3M
16 Msamples max , 4 Msamples/ch
4M
32 Msamples max , 8 Msamples/ch
J1
Jitter Analysis Software
J2
Disk Drive Analysis Software
J3E
TDSJIT3 v2.0 Essentials jitter analysis software (Replaces J3E)
JE3
Jitter Analysis - Essentials
JT3
TDSJIT3 Advanced Jitter Analysis application with random anTDSJIT3 Advanced Jitter Analysis application with random and deterministic jitter analysisd deterministic jitter analysis
USB
TDSUSBS-USB2.0 Compliance Test S/W Only
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