Hioki IM3570 Impedance Analyzer, Wide Band 4Hz-5Mz for High Speed Testing and Frequency Sweeping
Features:
Single Device Solution for High Speed Testing and Frequency Sweeping
The Hioki IM3570 Impedance Analyzer, LCR meter and impedance analyzer is capable of measurement frequencies of 4 Hz to 5 MHz and test signal levels of 5 mV to 5 V combined into one measuring instrument. Advanced capabilities include LCR measurement with AC signals, resistance measurement with direct current (DCR), and sweep measurement which continuously changes the measurement frequency and measurement level.
The IM3570 facilitates high-speed continuous measurement under different measurement conditions and measurement modes, so inspection lines which up to now have required multiple measuring instruments can be equipped with just one device.
The measurement time has been shortened from previous models, achieving maximum speeds of 1.5ms (1 kHz) and 0.5ms (100kHz) in LCR mode. ( When the display is off time increases by 0.3 ms when the display is on). This is a significant increase in speed compared with previous Hioki products (3522-50 and 3532-50 with basic speed of 5ms). Faster speed contributes to an increase in test quantities. Furthermore, sweep measurement, which requires multiple points to be measured, realizes the quick speed of 0.3ms per point.
Low-impedance measurement accuracy improved
A one-digit improvement in repeat accuracy during low-impedance measurement has been achieved compared with previous Hioki products. For example, when the condition is 1 mΩ (1V, 100 kHz) and the measurement speed is MED, stable measurement with a repeat accuracy (variation) of 0.12% is possible, making this instrument suitable for 100 kHz ESR measurement.
DCR and L-Q measurement of inductors (coils and transformers)
The instrument can continuously measure L-Q (1 kHz, 1mA constant current) and DCR, and display the numerical values on the same screen. Current dependent elements such as coils incorporating cores for which the inductance value varies depending on the applied current can be measured with a constant current (CC). Since there is a one-digit improvement in repeat accuracy during low impedance measurement compared with previous products, stable measurement of DCR can be expected.
By improving the measurement accuracy of 0 compared with previous Hioki products, measurement with an absolute accuracy and repeat accuracy of one-digit better than before can be performed for high Q and Rs values for which 0 is in the vicinity of 90°.
Product Features:
LCR, DCR, sweep, and continuous measurement with high-speed testing in a single unit
Maximum test speeds of 1.5ms (1 kHz) and 0.5ms (100kHz) in LCR mode
High basic accuracy of Z parameter: ±0.08%
Ideal for testing the resonance characteristics of piezoelectric elements, C-D and low ESR measurement of functional polymer capacitors, DCR and L-Q measurement of inductors (coils and transformers)
Perform frequency sweeps, level sweeps, and time interval measurements in analyzer mode
support for high-speed switching of measurement conditions