Chat Live
Contact Us
sales@valuetronics.com
The Agilent 4396A provides excellent RF vector network and spectrum measurements for lab and production applications. Gain, phase, group delay, distortion, spurious, CN, and noise measurements often required for evaluating components and circuits can be measured using one instrument. When combined with a test set, the Agilent HP 4396A provides reflection measurements, such as return loss, and SWR, and S parameters. As a vector network analyzer, the Agilent 4396A operates from 100 kHz to 1.8 GHz with 1 MHz resolution and its integrated synthesized source provides -60 to +20dBm of output power with 0.1dB resolution. The dynamic magnitude and phase accuracy are ±0.05 dB and ±0.3° so that it can accurately measure gain and group delay flatness, which are becoming more important in modern electronics systems.
As a spectrum analyzer, the Agilent 4396A operates from 2 Hz to 1.8 GHz with resolution-bandwidths (RBWs) spanning 1 Hz to 3 MHz in a 1-3-10 sequence. A fully synthesized local oscillator allows stable and accurate frequency analysis. Direct A/D conversion (no LOG amplifier is used) results in +/-1.0 dB overall level accuracy. Noise sidebands fall below -105 dBc/Hz offset from carriers below 1 GHz, while sensitivity is -150 dBm/Hz at 10 MHz and -147 dBm at 1 GHz. In addition, with two network and spectrum (or transmission and reflection) characteristics of the device under test in split-screen format. For example, an amplifier's frequency response (network measurement) and distortion (spectrum measurement) can be shown at the same time.
Extremely Fast Spectrum Measurement
The HP 4396A features a stepped Fast Fourier Transform (FFT) digital-signal-processing (DSP) technique for 20 to 100 times faster narrow band spectrum measurement than swept-tuned spectrum analyzers. The stepped FFT is performed when the resolution bandwidth (RBW) is set it 3 kHz or below. For example, with a 30 Hz RBW and 10 kHz span, the HP 4396A has a sweep time of 400 ms, while swept-tuned spectrum analyzers take a few tens of seconds. The stepped FFT can greatly improve the efficiency of narrow band spectrum measurement such as frequency tuning of a VCO or CN measurements.
Time-Gated Spectrum Analysis
With Option 1D6, the Agilent 4396A offers time-gated spectrum analysis capability to capture and measure repetitive burst signals in video, disk drives, communication equipment, and more. The minimum gate length is 2 µsec so that even narrow burst signals can be analyzed.
Impedance Measurement Function and RF Impedance Test Kit
A full-featured impedance measurement function (useful for quick-check general-purpose impedance applications) can be added to the Agilent 4396A by adding Option 010 and the HP 43961A RF impedance test kit. Covering from 100 kHz to 1.8 GHz, impedance parameters Ζ, Θ, C, L, Q, D, and more, are directly measured and displayed on the CRT. The basic impedance accuracy (typical value) is 3%. The Agilent 43961A RF impedance test kit is designed for the Agilent 4396A and is required to utilize the features of Option 010. An APC-7® connector is mounted on this kit for easy connection to an appropriate impedance test fixture. A wide variety of HP fixtures can be used with the test kit, including the new surface-mount-device (SMD) fixtures used with the Agilent 4291A RF impedance/material analyzer. For higher accuracy, complete impedance analysis over the widest impedance ranges, and temperature effects evaluation the HP 4291A impedance/material analyzer is recommended.
Model No
4396A
Condition
Used
Manufacturer
Agilent
Frequency
1.8 GHz
1C2
HP Instrument BASIC
1D5
High Stability Frequency Reference
1D6
Time-Gated Spectrum Analysis
30+ Years in Business
Secure Payments
Sell Test Equipments
Knowledgeable Staff
On-site Lab
30+ Years in Business
Secure Payments
Sell Test Equipments
Knowledgeable Staff
On-site Lab
