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Agilent 4288A 1 kHz/1 MHz Capacitance Meter (Pre-Owned)

Agilent 4288A 1 kHz/1 MHz Capacitance Meter (Pre-Owned)

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Agilent 4288A 1 kHz/1 MHz Capacitance Meter (Pre-Owned)

Key Features At A Glance

  • Dual test frequencies of 1 kHz and 1 MHz for compliance with IEC 60384 and JIS C5101 capacitor sorting standards
  • Basic measurement accuracy of ±0.07% for capacitance and ±0.0005 for dissipation factor with 6-digit display resolution
  • Selectable measurement times: 6.5 ms short mode and 16.5 ms long mode for high-throughput production sorting
  • Test signal levels selectable from 0.1 V to 1.0 V rms in 0.1 V steps with ±5% level accuracy across the capacitance range
  • Four-terminal pair measurement configuration with open/short/load/offset compensation functions
  • 9-bin comparator with auxiliary and out-of-bins sorting, plus pass/fail decisions for D, Q, G, Rs, or Rp
  • Standard GPIB (SCPI), optically-isolated handler, and 64-channel scanner interfaces with multi-channel compensation
  • Selectable 1 MHz frequency shift (-1%, +1%, +2%) to prevent test signal interference in multi-instrument array systems
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The Agilent 4288A 1 kHz/1 MHz Capacitance Meter is a high-speed capacitance measurement instrument designed for ceramic capacitor production testing. The datasheet positions the 4288A as a measurement solution combining 1 kHz and 1 MHz test frequencies, basic capacitance accuracy of ±0.07%, dissipation factor accuracy of ±0.0005, and selectable short-mode (6.5 ms) and long-mode (16.5 ms) measurement times. The instrument measures Cp, Cs, D, Q, G, Rs, and Rp parameters through a four-terminal pair configuration.

The datasheet identifies four production-test application areas for the 4288A: accelerating sorting test throughput on production lines, upgrading measurement-data accuracy for production process control, improving the efficiency and reliability of shipping inspection, and enhancing efficiency of high-volume capacitor incoming inspection. The 1 MHz frequency covers low-value capacitors from 1 pF to 1.5 nF, while the 1 kHz frequency covers medium- to high-value capacitors from 100 pF up to 20 µF, enabling sorting tests in compliance with the IEC 60384 and JIS C5101 standards named in the datasheet.

ValueTronics has supported the test and measurement community since 1992, operating from a 20,000 square foot secure warehouse at 1675 Cambridge Drive in Elgin, Illinois. Every instrument we list passes through our facility for inspection and performance verification by our in-house technicians before shipping. This direct ownership of the inspection workflow — rather than drop-shipping from third-party sources — is what allows us to stand behind the condition grades we publish and the warranty terms we offer on each {{CONDITION}} unit.

Brand Heritage

The 4288A carries the Agilent Technologies brand, which originated when Hewlett-Packard spun off its test and measurement division as Agilent in 1999. In 2014, Agilent's electronic measurement business was transferred to Keysight Technologies, which is the current corporate home for the legacy HP and Agilent test and measurement product lines.

Accessories Supplied

  • Power cable

Product Core & Specifications

Specification Value
Measurement Parameters
Parameters Cp, Cs, D, Q, G, Rs, Rp
Parameter combinations Cp-D, Cp-Q, Cp-G, Cp-Rp, Cs-D, Cs-Q, Cs-Rs
Cs, Cp display range (1 kHz) 0.00001 pF to 20.0000 µF
Cs, Cp display range (1 MHz) 0.00001 pF to 1.50000 nF
D display range 0.00001 to 9.99999
Q display range 0.1 to 99999.9
Rs, Rp display range 0.01 mΩ to 999.999 MΩ
G display range 0.00001 µS to 9.99999 kS
Δ% display range -999.999% to +999.999%
Measurement Range
Capacitance range at 1 kHz 100 pF to 10 µF, 16 ranges (over range 150%, 200% at 10 µF)
Capacitance range at 1 MHz 1 pF to 1 nF, 10 ranges (over range 150%)
Measurement Accuracy
Basic C accuracy (long mode) ±0.07%
Basic D accuracy (long mode) ±0.0005
C accuracy (short mode) ±0.085%
D accuracy (short mode) ±0.00065
Measurement Functions
Test frequency 1 kHz (±0.01%), 1 MHz (±0.01%)
Frequency shift 1 MHz can be varied to 990 kHz, 1.01 MHz or 1.02 MHz
Test signal level 0.1 V to 1.0 V rms in 0.1 V rms steps
Test signal level accuracy ±5% @ all C ranges
Source impedance (220 nF to 10 µF @ 1 kHz) 1 Ω (nominal)
Source impedance (100 pF to 100 nF @ 1 kHz) 20 Ω (nominal)
Source impedance (1 pF to 1 nF @ 1 MHz) 20 Ω (nominal)
Measurement terminals Four-terminal pair
Ranging Auto and manual
Display digits Selectable from 4, 5 and 6 digits
Deviation measurement Deviation and percent deviation from a reference
Measurement time mode Short and long
Averaging 1 to 256
Trigger mode Internal, external, manual and GPIB
Delay time Programmable 0 to 1000 ms in 1 ms steps
Cable length 0 m, 1 m and 2 m
Measurement Time
Short mode 6.5 ms ±0.5 (T1=4.5, T2=2)
Long mode 16.5 ms ±1 (T1=14.5, T2=2)
Compensation
Open/short compensation Stray C and residual L: No limits; Residual G: ≤ 20 µS; Residual R: ≤ 20 Ω
Load compensation Valid at selected frequency only
Offset compensation Subtracts desired compensation values from measured values
Scanner multi-compensation Open/short/load compensation for up to 64 channels
Comparator
Bins 9 bins and out of bins for C; Pass/fail decision for D, Q, G, Rs and Rp
Status outputs AUX, P-Hi, P-Lo, S-Reject, Low C Reject
Limit setting Absolute value, deviation and % deviation
Bin count 0 to 999999
Circuit Protection
Max withstanding discharge voltage (typical) √(2/C) V and ≤ 1000 V
Memory and Setup
Resume function memory period (typical) 72 hours @ 23 °C ±5 °C
Save/Recall 10 instrument setups in non-volatile memory
Interfaces
GPIB Complies with IEEE-488.1 and 488.2; SCPI programming language
Data buffer Up to 1000 sets of measured values and comparator decision results
Handler interface Negative true logic, optically-isolated open collector signals
Handler output signals Bin 1 to 9, out of bins, aux bin, P-Hi, P-Lo, S-reject, Low C, index, EOM, Ready for Trigger, Overload, Alarm
Handler input signals External trigger and keylock
Scanner interface Open/short/load compensation for up to 64 channels
Scanner output signals Index and EOM
Scanner input signals CH0 to CH5 (channel identification), external trigger, CH VALID
Supplemental Data (Typical)
Test signal voltage resolution 1 mV rms
Voltage monitor accuracy ±(3% of reading + 1 mV)
Measurement stability C (long mode) ≤ 0.005% / 24 hours
Measurement stability D (long mode) ≤ 0.00005 / 24 hours
Temperature coefficient C ≤ 0.001% / °C
Temperature coefficient D ≤ 0.00001 / °C
Settling time (frequency) 10 ms
Settling time (test signal level) 10 ms
General
Power requirement 90 V to 132 V, 198 V to 264 V ac, 47 Hz to 66 Hz, 35 W/100 VA max
Operating temperature 0 °C to 45 °C
Operating humidity 15% to 95% RH @ ≤ 40 °C, no condensation
Dimensions 320 mm (W) × 100 mm (H) × 300 mm (D) (12.6 in × 3.9 in × 11.8 in)
Weight Approximately 3 kg (6.6 lbs)
Important: Maximum withstanding discharge voltage (typical): √(2/C) volts and ≤1000 V, where C is the capacitance value of the measured device. Discharge test device before connecting to the UNKNOWN terminals.Important: Test fixtures are not furnished as standard with the 4288A. The appropriate test fixture and/or test leads must be ordered separately to match the device-under-test geometry (SMD, axial lead, array-type, etc.) — see Ordering Information.Important: The operation manual is not furnished as standard. One of the language options (4288A-ABA U.S. English or 4288A-ABJ Japanese) must be specified for the manual to ship with the product.Important: For test fixtures 16043B, 16044A, and 16047E, a language option (ABA or ABJ) must be specified for the operation manual to ship with the product.Important: The Rack flange handle kit is not compatible with the 4288A.Important: Basic accuracy specifications apply to the measurement time long mode.Important: Measurement accuracy is guaranteed at the unknown terminals when: warm-up time ≥ 10 min, ambient temperature 23 °C ±5 °C, cable length 0 m, 1 m or 2 m (16048A/B/D), open compensation performed, and measured D value Dx ≤ 0.1.Recommended pairing: select the test fixture matched to the component form factor — 16044A for 4-terminal SMD measurements, 16034G for small 2-terminal SMD (down to 0.6 × 0.3 mm), 16034H for array-type SMD components, or 16334A tweezer fixture for ad-hoc SMD probing. Pair the chosen fixture with a 16048A, 16048B, or 16048D four-terminal pair test lead as listed in the datasheet.

About this used unit

  • Warranty included
  • Functional verification included
  • Standard Calibration Upgrade Options: No Calibration Required, NIST Traceable, Z540.1 or ISO 17025 with Data, Z540.3 Guardbanding with Data.
  • Note that unnecessary accessories may not be included (contact Test Architect to confirm).

Please review the Manufacturer's Data Sheet to verify published specifications. Feedback on this webpage is always welcome — please reach out to your Test Architect at any time for questions or concerns. Thank you, we truly appreciate you being our customer.

Model No

Agilent

Condition

Used

Manufacturer

Agilent

Type

Bench