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Stanford Research Systems DG535 Digital Delay/Pulse Generator (Pre-Owned)

Stanford Research Systems DG535 Digital Delay/Pulse Generator (Pre-Owned)

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Stanford Research Systems DG535 Digital Delay/Pulse Generator (Pre-Owned)

Key Features At A Glance

  • Four independent delay channels (A, B, C, D) with 5 ps delay resolution on every channel
  • Delay range from 0 to roughly 1000 seconds from an internal or external trigger
  • Less than 50 ps rms channel-to-channel jitter for delays under 100 µs (scales with delay setting)
  • Outputs adjustable from −3 V to +4 V (10 mV resolution) with TTL, ECL, and NIM presets
  • Internal trigger from 1 mHz to 1 MHz plus external, single-shot, and burst modes
  • Standard GPIB (IEEE-488) interface for full remote control and ATE integration
  • Pulse outputs (AB, −AB, CD, −CD) with widths as short as 4 ns FWHM
  • Optional ±32 V rear-panel outputs and optional 1 ppm TCXO timebase
View full details

The DG535 is a digital delay/pulse generator that provides four precisely-timed logic transitions or two independent pulse outputs. Its four delay output channels — A, B, C and D — can be delayed from an internal or external trigger by up to 1000 seconds in 5 ps increments, with a T0 pulse marking the beginning of each timing cycle. Front-panel BNC outputs deliver TTL, ECL, NIM, or variable-level pulses into 50 Ω or high-impedance loads, giving an engineer direct control over both the timing and the electrical form of every transition. Delays for each channel may be linked to T0 or to any other channel, so that, for example, two outputs defining a pulse can hold a constant width while the pulse is moved in time.

The combination of high accuracy, low jitter, and a wide delay range suits the DG535 to laser timing systems, automated testing, and precision pulse applications. In an ATE setup-time measurement, the unit can characterize the data, preset, and clear setup times of a flip-flop with picosecond resolution, driving the device-under-test at programmable logic thresholds and controlling the entire sequence over GPIB. In precision time-sequencing systems, a single unit supplies four transitions for system timing, and several units can be combined — sharing a common 10 MHz reference — when more channels are required. In laser timing, the T0 output can fire a flashlamp while the A, B, and C delays sequence the Q-switch firing, an experimental trigger, and a gated-integrator trigger.

ValueTronics stocks and holds its own inventory in a 20,000-square-foot secure warehouse at 1675 Cambridge Drive in Elgin, Illinois, so the instruments we list are equipment we keep on hand. Every used unit is inspected and functionally verified in-house by our technicians before it ships, while new units leave our facility factory-sealed exactly as received from the manufacturer.

Product Core & Specifications

Specification Value
Delays
Channels Four independent delay outputs
Range 0 to 999.999,999,999,995 seconds
Resolution 5 ps
Accuracy 1500 ps + timebase error × delay
Timebase Standard: 25 ppm crystal oscillator; Optional: 1 ppm TCXO (opt. 03); External: 10.0 MHz reference input
RMS jitter <50 ps + 10−8 × delay (T0 to any output); <60 ps + 10−8 × delay (ext. trigger to any output)
Trigger delay (typ.) 85 ns (ext. trigger to T0 output)
External Trigger
Rate DC to 1/(1 µs + longest delay)
Threshold ±2.56 VDC
Resolution 10 mV
Slope Trigger on rising or falling edge
Impedance 1 MΩ + 40 pF or 50 Ω
Internal Rate Generator
Rate Single shot, 0.001 Hz to 1.000 MHz, or line
Resolution Four digits, 0.001 Hz below 10 Hz
Accuracy Same as timebase
Jitter 1:10,000
Settling <2 seconds for any rate change
Burst mode 2 to 32766 pulses per burst at integer multiples (4 to 32767) of the trigger period
Outputs
Load 50 Ω or high impedance
Rise time 2 to 3 ns (typ.)
Slew rate 1 V/ns
Overshoot <100 mV + 10 % of pulse amplitude
Levels TTL: 0 to 4 VDC (normal or inverted); ECL: −1.8 to −0.8 VDC (normal or inverted); NIM: −0.8 to 0.0 VDC (normal or inverted); VAR: Adjustable offset and amplitude between −3 and +4 VDC with 10 mV resolution. 4 V maximum transition.
Accuracy ±(50 mV + 3 % of pulse amplitude)
Option 02
Option 02 Rear panel 1 µs pulses corresponding to T0, A, B, C, D outputs with nominal amplitude of 8× the front-panel outputs (1 kHz rep. rate). Output level is reduced by 2V/mA of additional average output current.
Fast Rise Time (opt. O4A)
Output amplitude +0.5 to 2.0 VDC
Output offset −0.8 VDC (typ.)
Transition time, Rise (20/80 %) 100 ps (max.)
Transition time, Fall (20/80 %) 2000 ps (max.)
Pulse aberrations, Foot 4 % (typ.)
Pulse aberrations, Ring ±5 % (typ.)
Fast Fall Time (opt. O4B)
Output amplitude −0.5 to −2.0 VDC
Output offset +0.8 VDC (typ.)
Transition time, Rise (20/80 %) 2500 ps (max.)
Transition time, Fall (20/80 %) 100 ps (max.)
Pulse aberrations, Foot 4 % (typ.)
Pulse aberrations, Ring ±5 % (typ.)
General
Display backlit 20-character LCD
Computer interface GPIB (IEEE-488). All instrument functions and settings may be controlled over the interface bus. Interface queue can be viewed from the front panel.
Dimensions 8.5" × 4.75" × 14" (WHD)
Weight 10 lbs.
Power 70 W, 100/120/220/240 VAC, 50/60 Hz
Warranty One year parts and labor on defects in materials and workmanship
Timebase Error
Standard <25 ppm, 0 to 50 °C
Option 03 <1 ppm, 0 to 50 °C
External Source spec + 0.0002 ppm
Important: Each output's variable level is adjustable between −3 V and +4 V with 10 mV resolution, and the maximum transition for each output is limited to 4 V.
Usage tip: in laser timing applications, the DG535 pairs with the SR250 Gated Integrator — the C delay output triggers the gated integrator monitoring the detector output.

About this Pre-Owned unit

This pre-owned unit is inspected and functionally verified in-house before it ships and is backed by our pre-owned warranty. To confirm its exact condition, firmware revision, installed options, or included accessories for your application before ordering, contact our Test Architects.

  • Warranty included
  • Functional verification included
  • Standard Calibration Upgrade Options: No Calibration Required, NIST Traceable, Z540.1 or ISO 17025 with Data, Z540.3 Guardbanding with Data.
  • Note that unnecessary accessories may not be included (contact Test Architect to confirm).

ValueTronics supplies both new and used test and measurement equipment. New units ship factory-sealed, exactly as received from the manufacturer; every used unit is inspected and functionally verified in-house at our 20,000 sq ft secure facility in Elgin, Illinois before it ships. Our Test Architects can help you select the condition, calibration, and configuration that fit your application.

Please review the Manufacturer's Data Sheet to verify published specifications. Feedback on this webpage is always welcome — please reach out to your Test Architect at any time for questions or concerns. Thank you, we truly appreciate you being our customer.

Model No

Stanford

Condition

Pre-Owned

Manufacturer

Stanford Research Systems

Func_gen_freq

1 MHz