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Simultaneous measurements on multiple channels improves throughput by eliminating the need to sequentially measure individual channels of a parallel optic component, but rather allowing multiple channels to be measured at the same time. For network equipment manufacturers, throughput is improved by allowing multiple devices, or multiple ports on a single device to be tested at the same time.
Model No
86115B
Condition
Used
Manufacturer
Agilent
30+ Years in Business
Secure Payments
Sell Test Equipments
Knowledgeable Staff
On-site Lab
30+ Years in Business
Secure Payments
Sell Test Equipments
Knowledgeable Staff
On-site Lab
