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4141B Agilent Semiconductor Parameter Analyzer Used

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Calibrations None NIST Traceable NIST Traceable With Full Data ISO IEC 17025 Accredited

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Additional Features:

Designed for use as a system component in user-designed semiconductor I-V or DC parametric test systems
Wide DC measurement range, high resolution, high-speed measurement capabilities, remote sensing, and high accuracy
Will contribute towards quality improvement and increased measurement throughput in the lab or on the production line.
The unit is rated DC to ±100V @ 20mA

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The Agilent 4141B pA Meter / DC Voltage Source consists of an extremely stable picoampere meter and two programmable DC voltage sources, one of which operates as a ramp and staircase generator as well as a DC source. These features make the unit ideal for making DC characteristic measurements such as leakage current, current-voltage characteristics and quasi-static C-V measurements required by the semiconductor industry for new product development and for improving production yields. It is equally useful in measurements of electronic components and materials to determine leakage currents or insulation resistances.

Model No

4141B

Condition

Used

Manufacturer

Agilent

HP_4141B_Operation_Manual

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4141B Agilent Semiconductor Parameter Analyzer Used