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Used

BSA175C Tektronix Analyzer Used

BSA175C Tektronix Analyzer Used

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Features:

  • 17.5 Gb/s
  • 100 MHz
  • Integrated, calibrated stress generation to address the stressed receiver sensitivity and clock recovery jitter tolerance test requirements for a wide range of standards
  • Electrical stressed eye testing
  • Tolerance compliance template testing with margin testing
  • Integrated eye diagram analysis with BER correlation
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Applications:  

  • Design verification including signal integrity, jitter, and timing analysis
  • Design characterization for high-speed, sophisticated designs
  • Certification testing of serial data streams and high performance Networking systems
  • Design/Verification of high-speed I/O components and systems
  • Signal integrity analysis – mask testing, jitter peak, BER contour, jitter map, and q-factor analysis
  • Design/Verification of optical transceivers

The Tektronix BSA175C is an analyzer.

Model No

BSA175C

Condition

Used

Manufacturer

Tektronix

ECC

Add Error Correction Coding Emulation SW (included in STR)

F2

F/2 Jitter Generation at 8G/10.3125G (requires STR)

GSM

Generator Stress Module – Stressed Eye

JTOL

Add Jitter Tolerance Templates SW (included in STR)

MAP

Add Error Mapping Analysis SW (included in STR)

PL

Add Physical Layer Test Suite SW (included in STR)

SF

Add Symbol Filtering option SW (used with STR)

SLD

Add Stressed Live Data option SW

STR

Stressed Signal Generation (includes option ECC , MAP , PL , XSSC , JTOL)

XSSC

Extended Spread Spectrum Clocking (SSC) (included in STR)