Skip to product information
1 of 1

Stanford Research Systems SR770 100 kHz FFT Spectrum Analyzer with Source (Pre-Owned)

Stanford Research Systems SR770 100 kHz FFT Spectrum Analyzer with Source (Pre-Owned)

Calibrations

🎓 Request a Quote To Get An EDU Discount

Login & Get 2% Back on Purchases
Login or Sign Up for Loyalty

Stanford Research Systems SR770 100 kHz FFT Spectrum Analyzer with Source (Pre-Owned)

Key Features At A Glance

  • Single-channel FFT spectrum analysis from DC to 100 kHz with 100 kHz real-time bandwidth (no dead time)
  • 90 dB dynamic range; signals as small as −114 dBc observable using averaging
  • Dual high-speed 24-bit DSPs with a 16-bit A/D converter sampling at 256 kHz
  • GPIB (IEEE-488.2), RS-232, and Centronics printer interfaces standard for automated measurement systems
  • 15- and 30-band 1/3-octave analysis with A-weighting for acoustics and noise measurement
  • Built-in harmonic, sideband, and band analysis with THD computation
  • Available as the SR770 variant adding a low-distortion synthesized DDS source for frequency response measurements
  • 3.5" DOS-compatible disk drive plus hardcopy to dot-matrix/LaserJet printers and HP-GL plotters
View full details

The SR760 and SR770 are single-channel 100 kHz FFT spectrum analyzers offering a 90 dB dynamic range and a 100 kHz real-time bandwidth. Both instruments cover spectrum analysis across the low-frequency and audio band, while the SR770 additionally integrates a low-distortion synthesized source that allows measurement of the transfer functions of electronic and mechanical systems. The combination of speed, dynamic range, and multiple analysis modes makes the pair suitable for a variety of measurement tasks.

Listed applications for these analyzers include acoustics, vibration, noise measurement, and general electronic use. The 15- and 30-band 1/3-octave spectra, with available A-weighting compensation, target acoustics and noise measurement work, computing amplitudes from band −2 (630 mHz) through band 49 (80 kHz). With its low-distortion DDS source, the SR770 performs frequency response measurements on control systems, amplifiers, and electro-mechanical systems, displaying the resulting Bode plot.

ValueTronics stocks and holds its own inventory in a 20,000-square-foot secure warehouse at 1675 Cambridge Drive in Elgin, Illinois. Every pre-owned instrument is inspected and functionally verified in-house before it ships, while new units leave the warehouse factory-sealed exactly as received. That combination of on-hand stock and used-unit verification lets buyers source the right analyzer with confidence in its condition.

Compare Other Models in This Series

The SR760 and SR770 form a two-model line of single-channel 100 kHz FFT spectrum analyzers that share the same core architecture: a 90 dB dynamic range, a 100 kHz real-time bandwidth, dual 24-bit DSPs, and a 16-bit A/D converter sampling at 256 kHz. Both models provide spectrum, power spectral density, time record, and 1/3-octave measurements along with harmonic, sideband, and band analysis.

The defining difference within the family is the synthesized source: the SR770 integrates a low-distortion DDS source for frequency response and transfer function measurements, while the SR760 covers the same spectrum and octave analysis without an internal source.

Each pre-owned model below is its own dedicated product page with condition-matched pricing. Choose the SR760 or SR770 listing that matches your configuration to view the specifications and availability for that pre-owned unit.

The SR770 is distinguished within the line by its built-in low-distortion synthesized source, which adds two-tone IMD test signals, pink and white noise, and chirp output, and enables transfer function measurements to 0.05 dB precision that the source-less SR760 does not provide.

The principal difference shown in the comparison table is the source: the SR770 includes the synthesized DDS source for frequency response work, and the SR760 does not. This distinction is also reflected in the list pricing of the two configurations.

A secondary difference is disk capacity — the 3.5" drive stores 1.44 Mbyte on the SR770 and 720 kbyte on the SR760. Aside from the source and disk capacity, the two models share the same frequency range, dynamic range, real-time bandwidth, input characteristics, analysis modes, and interface set, as the table that follows details.

Model Frequency Range Dynamic Range Real-Time Bandwidth
SR770 476 µHz to 100 kHz 90 dB (typ.) 100 kHz
SR760 476 µHz to 100 kHz 90 dB (typ.) 100 kHz

Additional differences in specifications beyond the few shown above are not listed here — see each model's full specifications below.

Product Core & Specifications

Specification Value
Frequency
Measurement range 476 µHz to 100 kHz
Spans 191 mHz to 100 kHz (in a binary sequence)
Center frequency Anywhere within the 0 to 100 kHz measurement range
Accuracy 25 ppm from 20 °C to 40 °C
Resolution Span/400
Window functions Blackman-Harris, Hanning, Flat-Top and Uniform
Real-time bandwidth 100 kHz
Signal Input
Number of channels 1
Input Single-ended or differential
Input impedance 1 MΩ, 15 pF
Coupling AC or DC
CMRR (at 1 kHz) 90 dB (input range < −6 dBV); 80 dB (input range <14 dBV); 50 dB (input range ≥14 dBV)
Noise (Typical) 5 nVrms/√Hz at 1 kHz (−166 dBVrms/√Hz)
Noise (Maximum) 10 nVrms/√Hz (−160 dBVrms/√Hz)
Amplitude
Full-scale input range −60 dBV (1.0 mVp) to +34 dBV (50 Vp) in 2 dB steps
Dynamic range 90 dB (typ.)
Harmonic distortion No greater than −80 dB from DC to 100 kHz (input range 0 dBV)
Spurious No greater than −85 dB below full scale (<200 Hz). No greater than −90 dB below full scale (to 100 kHz). (−50 dBV input range)
Input sampling 16-bit A/D at 256 kHz
Accuracy ±0.3 dB ± 0.02 % of full scale (excluding windowing effects)
Averaging RMS, Vector and Peak Hold. Linear and exponential averaging up to 64k scans.
Trigger Input
Modes Continuous, internal, external, TTL
Internal level Adjustable to ±100 % of input scale. (Positive or negative slope)
Min. trigger amplitude (internal) 10 % of input range
External level ±5 V in 40 mV steps, 10 kΩ impedance (Positive or negative slope)
Min. trigger amplitude (external) 100 mV
External TTL Requires TTL level (low <0.7 V, high >2 V)
Post-trigger Measurement record is delayed by 1 to 65,000 samples (1/512 to 127 time records) after the trigger. Delay resolution is 1 sample (1/512 of a record).
Pre-trigger Measurement record starts up to 51.953 ms prior to the trigger. Delay resolution is 3.9062 ms.
Phase indeterminacy <2°
Display Functions
Display Real, imaginary, magnitude or phase
Measurements Spectrum, power spectral density, time record and 1/3 octave
Analysis Band, sideband, total harmonic distortion and trace math
Graphic expand Display expand up to ×50 about any point
Harmonic marker Displays up to 400 harmonics
Data tables Lists Y values of up to 200 points
Limit tables Detects data exceeding up to 100 user-defined upper and lower limit trace segments.
Source (SR770 only)
Amplitude range 0.1 mVp to 1.0 Vp
Amplitude resolution 1 mVp (output >100 mVp), 0.1 mVp (output <100 mVp)
DC offset <10.0 mV (typ.)
Output impedance <5 Ω, 50 mA peak output current
Sine Source
Frequency range DC to 100 kHz
Resolution 15.26 mHz
Amplitude accuracy ±1 % (0.09 dB) of setting
Spectral purity (Harmonics and sub-harmonics) −80 dBc, f <10 kHz; −70 dBc, f >10 kHz
Spectral purity (Spurious) < −100 dB full scale
Two-Tone Source
Frequency range DC to 100 kHz
Resolution 15.26 mHz
Amplitude accuracy ±1 % (0.09 dB) of setting
Spectral purity (Harmonics and sub-harmonics) −80 dBc (f <10 kHz); −70 dBc (f >10 kHz)
Spectral purity (Spurious) < −100 dB full scale
White Noise Source
Frequency range DC to 100 kHz (all spans)
Flatness <1.0 dBpp (rms averaged spectra)
Pink Noise Source
Frequency range DC to 100 kHz (all spans)
Flatness <4.0 dBpp (using 1/3 oct. analysis)
Chirp Source
Output Equal amplitude sine waves at each frequency bin of the current span
Flatness <0.05 dBpp (typ.); <0.2 dBpp (max.)
Phase AutoPhase function calibrates to current phase spectrum.
General
Monitor Monochrome CRT, 640H by 480V resolution, adjustable brightness and position
Interfaces IEEE-488.2, RS-232 and Printer interfaces standard. An XT keyboard input is provided for additional flexibility.
Hardcopy Screen dumps and table and setting listings to dot matrix and LaserJet compatible printers. Data plots to HP-GL compatible plotters (RS-232 or IEEE-488.2).
Disk 3.5" DOS compatible format, 1.44 Mbyte capacity. Stores data and instrument configurations.
Power 60 W, 100/120/220/240 VAC, 50/60 Hz
Dimensions 17" × 6.25" × 18.5" (WHD)
Weight 36 lbs.
Warranty One year parts and labor on defects in materials and workmanship

About this Pre-Owned unit

This pre-owned unit is inspected and functionally verified in-house before it ships and is backed by our pre-owned warranty. To confirm its exact condition, firmware revision, installed options, or included accessories for your application before ordering, contact our Test Architects.

  • Warranty included
  • Functional verification included
  • Standard Calibration Upgrade Options: No Calibration Required, NIST Traceable, Z540.1 or ISO 17025 with Data, Z540.3 Guardbanding with Data.
  • Note that unnecessary accessories may not be included (contact Test Architect to confirm).

ValueTronics supplies both new and used test and measurement equipment. New units ship factory-sealed, exactly as received from the manufacturer; every used unit is inspected and functionally verified in-house at our 20,000 sq ft secure facility in Elgin, Illinois before it ships. Our Test Architects can help you select the condition, calibration, and configuration that fit your application.

Please review the Manufacturer's Data Sheet to verify published specifications. Feedback on this webpage is always welcome — please reach out to your Test Architect at any time for questions or concerns. Thank you, we truly appreciate you being our customer.

Model No

Stanford

Condition

Pre-Owned

Manufacturer

Stanford Research Systems

Spec_ana_freq

100 kHz