Skip to product information
1 of 1
Used

BSX125 Tektronix Analyzer Used

BSX125 Tektronix Analyzer Used

Shipping calculated at checkout.
check availability
Login & Get 2% Back on Purchases
Login or Sign Up for Loyalty

Features:

  • Pattern Generation and Error Analysis up to 32 Gb/s
  • Provides a single solution for Receiver stress testing, debug and compliance
  • Test Gen3 and Gen4 standards including PCIe, SAS, and USB3.1 and proprietary standards
  • DUT handshaking capability above16 Gb/s supporting RX test requirements for loopback initiation and adaptive link training for key standards such as PCIe
  • Protocol-aware pattern generation and error detection supports flexible stimulus response programmability and debugging of handshaking issues.
  • Forward error correction (FEC) emulation option supports measurement of BER both before and after error correction for commonly used Reed-Solomon FEC codes.
  • Calibration and test automation software available for key standards
Share on
View full details

Key performance specifications

  • Pattern Generation and Error Analysis up to 32 Gb/s
  • Optional built-in 4-tap Tx equalization with support for interactive link training
  • Protocol-oriented and bit-oriented multi-chain pattern sequencing with enhanced pattern/sequence editor
  • User-defined detector pattern matching with stimulus-response feedback
  • Patented Error Location Analysis™ goes beyond BER measurement to provide insight into the sources of errors through analysis of correlations and deterministic error patterns
  • Optional Forward Error Correction analysis provides for simulation of post-FEC error rate based upon measured error location patterns
  • Integrated Eye Diagram Analysis with BER Correlation including Mask Testing, Jitter Peak, BER Contour
  • Optional Jitter Map Comprehensive Jitter Decomposition - with Long Pattern (i.e. PRBS-31) Jitter

Applications

  • Design verification including signal integrity, jitter, and timing analysis
  • Design characterization for high-speed, sophisticated designs
  • Design/Verification of high-speed I/O components and systems including DUT handshaking
  • Signal integrity analysis – mask testing, jitter peak, BER contour, jitter map, and forward error correction emulation

Model No

BSX125

Condition

Used

Manufacturer

Tektronix