# Stanford Research Systems SR770 100 kHz FFT Spectrum Analyzer with Source (Pre-Owned)

# Stanford Research Systems SR770 100 kHz FFT Spectrum Analyzer with Source (Pre-Owned)

## Key Features At A Glance

-   Single-channel FFT spectrum analysis from DC to 100 kHz with 100 kHz real-time bandwidth (no dead time)
-   90 dB dynamic range; signals as small as −114 dBc observable using averaging
-   Dual high-speed 24-bit DSPs with a 16-bit A/D converter sampling at 256 kHz
-   GPIB (IEEE-488.2), RS-232, and Centronics printer interfaces standard for automated measurement systems
-   15- and 30-band 1/3-octave analysis with A-weighting for acoustics and noise measurement
-   Built-in harmonic, sideband, and band analysis with THD computation
-   Available as the SR770 variant adding a low-distortion synthesized DDS source for frequency response measurements
-   3.5" DOS-compatible disk drive plus hardcopy to dot-matrix/LaserJet printers and HP-GL plotters

The SR760 and SR770 are single-channel 100 kHz FFT spectrum analyzers offering a 90 dB dynamic range and a 100 kHz real-time bandwidth. Both instruments cover spectrum analysis across the low-frequency and audio band, while the SR770 additionally integrates a low-distortion synthesized source that allows measurement of the transfer functions of electronic and mechanical systems. The combination of speed, dynamic range, and multiple analysis modes makes the pair suitable for a variety of measurement tasks.

Listed applications for these analyzers include acoustics, vibration, noise measurement, and general electronic use. The 15- and 30-band 1/3-octave spectra, with available A-weighting compensation, target acoustics and noise measurement work, computing amplitudes from band −2 (630 mHz) through band 49 (80 kHz). With its low-distortion DDS source, the SR770 performs frequency response measurements on control systems, amplifiers, and electro-mechanical systems, displaying the resulting Bode plot.

ValueTronics stocks and holds its own inventory in a 20,000-square-foot secure warehouse at 1675 Cambridge Drive in Elgin, Illinois. Every pre-owned instrument is inspected and functionally verified in-house before it ships, while new units leave the warehouse factory-sealed exactly as received. That combination of on-hand stock and used-unit verification lets buyers source the right analyzer with confidence in its condition.

## Compare Other Models in This Series

The SR760 and SR770 form a two-model line of single-channel 100 kHz FFT spectrum analyzers that share the same core architecture: a 90 dB dynamic range, a 100 kHz real-time bandwidth, dual 24-bit DSPs, and a 16-bit A/D converter sampling at 256 kHz. Both models provide spectrum, power spectral density, time record, and 1/3-octave measurements along with harmonic, sideband, and band analysis.

The defining difference within the family is the synthesized source: the SR770 integrates a low-distortion DDS source for frequency response and transfer function measurements, while the SR760 covers the same spectrum and octave analysis without an internal source.

Each pre-owned model below is its own dedicated product page with condition-matched pricing. Choose the SR760 or SR770 listing that matches your configuration to view the specifications and availability for that pre-owned unit.

The SR770 is distinguished within the line by its built-in low-distortion synthesized source, which adds two-tone IMD test signals, pink and white noise, and chirp output, and enables transfer function measurements to 0.05 dB precision that the source-less SR760 does not provide.

The principal difference shown in the comparison table is the source: the SR770 includes the synthesized DDS source for frequency response work, and the SR760 does not. This distinction is also reflected in the list pricing of the two configurations.

A secondary difference is disk capacity — the 3.5" drive stores 1.44 Mbyte on the SR770 and 720 kbyte on the SR760. Aside from the source and disk capacity, the two models share the same frequency range, dynamic range, real-time bandwidth, input characteristics, analysis modes, and interface set, as the table that follows details.

Model

Frequency Range

Dynamic Range

Real-Time Bandwidth

**SR770**

476 µHz to 100 kHz

90 dB (typ.)

100 kHz

SR760

476 µHz to 100 kHz

90 dB (typ.)

100 kHz

Additional differences in specifications beyond the few shown above are not listed here — see each model's full specifications below.

## Product Core & Specifications

Specification

Value

Frequency

Measurement range

476 µHz to 100 kHz

Spans

191 mHz to 100 kHz (in a binary sequence)

Center frequency

Anywhere within the 0 to 100 kHz measurement range

Accuracy

25 ppm from 20 °C to 40 °C

Resolution

Span/400

Window functions

Blackman-Harris, Hanning, Flat-Top and Uniform

Real-time bandwidth

100 kHz

Signal Input

Number of channels

1

Input

Single-ended or differential

Input impedance

1 MΩ, 15 pF

Coupling

AC or DC

CMRR (at 1 kHz)

90 dB (input range < −6 dBV); 80 dB (input range <14 dBV); 50 dB (input range ≥14 dBV)

Noise (Typical)

5 nVrms/√Hz at 1 kHz (−166 dBVrms/√Hz)

Noise (Maximum)

10 nVrms/√Hz (−160 dBVrms/√Hz)

Amplitude

Full-scale input range

−60 dBV (1.0 mVp) to +34 dBV (50 Vp) in 2 dB steps

Dynamic range

90 dB (typ.)

Harmonic distortion

No greater than −80 dB from DC to 100 kHz (input range 0 dBV)

Spurious

No greater than −85 dB below full scale (<200 Hz). No greater than −90 dB below full scale (to 100 kHz). (−50 dBV input range)

Input sampling

16-bit A/D at 256 kHz

Accuracy

±0.3 dB ± 0.02 % of full scale (excluding windowing effects)

Averaging

RMS, Vector and Peak Hold. Linear and exponential averaging up to 64k scans.

Trigger Input

Modes

Continuous, internal, external, TTL

Internal level

Adjustable to ±100 % of input scale. (Positive or negative slope)

Min. trigger amplitude (internal)

10 % of input range

External level

±5 V in 40 mV steps, 10 kΩ impedance (Positive or negative slope)

Min. trigger amplitude (external)

100 mV

External TTL

Requires TTL level (low <0.7 V, high >2 V)

Post-trigger

Measurement record is delayed by 1 to 65,000 samples (1/512 to 127 time records) after the trigger. Delay resolution is 1 sample (1/512 of a record).

Pre-trigger

Measurement record starts up to 51.953 ms prior to the trigger. Delay resolution is 3.9062 ms.

Phase indeterminacy

<2°

Display Functions

Display

Real, imaginary, magnitude or phase

Measurements

Spectrum, power spectral density, time record and 1/3 octave

Analysis

Band, sideband, total harmonic distortion and trace math

Graphic expand

Display expand up to ×50 about any point

Harmonic marker

Displays up to 400 harmonics

Data tables

Lists Y values of up to 200 points

Limit tables

Detects data exceeding up to 100 user-defined upper and lower limit trace segments.

Source (SR770 only)

Amplitude range

0.1 mVp to 1.0 Vp

Amplitude resolution

1 mVp (output >100 mVp), 0.1 mVp (output <100 mVp)

DC offset

<10.0 mV (typ.)

Output impedance

<5 Ω, 50 mA peak output current

Sine Source

Frequency range

DC to 100 kHz

Resolution

15.26 mHz

Amplitude accuracy

±1 % (0.09 dB) of setting

Spectral purity (Harmonics and sub-harmonics)

−80 dBc, f <10 kHz; −70 dBc, f >10 kHz

Spectral purity (Spurious)

< −100 dB full scale

Two-Tone Source

Frequency range

DC to 100 kHz

Resolution

15.26 mHz

Amplitude accuracy

±1 % (0.09 dB) of setting

Spectral purity (Harmonics and sub-harmonics)

−80 dBc (f <10 kHz); −70 dBc (f >10 kHz)

Spectral purity (Spurious)

< −100 dB full scale

White Noise Source

Frequency range

DC to 100 kHz (all spans)

Flatness

<1.0 dBpp (rms averaged spectra)

Pink Noise Source

Frequency range

DC to 100 kHz (all spans)

Flatness

<4.0 dBpp (using 1/3 oct. analysis)

Chirp Source

Output

Equal amplitude sine waves at each frequency bin of the current span

Flatness

<0.05 dBpp (typ.); <0.2 dBpp (max.)

Phase

AutoPhase function calibrates to current phase spectrum.

General

Monitor

Monochrome CRT, 640H by 480V resolution, adjustable brightness and position

Interfaces

IEEE-488.2, RS-232 and Printer interfaces standard. An XT keyboard input is provided for additional flexibility.

Hardcopy

Screen dumps and table and setting listings to dot matrix and LaserJet compatible printers. Data plots to HP-GL compatible plotters (RS-232 or IEEE-488.2).

Disk

3.5" DOS compatible format, 1.44 Mbyte capacity. Stores data and instrument configurations.

Power

60 W, 100/120/220/240 VAC, 50/60 Hz

Dimensions

17" × 6.25" × 18.5" (WHD)

Weight

36 lbs.

Warranty

One year parts and labor on defects in materials and workmanship

## About this Pre-Owned unit

This pre-owned unit is inspected and functionally verified in-house before it ships and is backed by our pre-owned warranty. To confirm its exact condition, firmware revision, installed options, or included accessories for your application before ordering, contact our Test Architects.

-   Warranty included
-   Functional verification included
-   Standard Calibration Upgrade Options: No Calibration Required, NIST Traceable, Z540.1 or ISO 17025 with Data, Z540.3 Guardbanding with Data.
-   Note that unnecessary accessories may not be included (contact Test Architect to confirm).

ValueTronics supplies both new and used test and measurement equipment. New units ship factory-sealed, exactly as received from the manufacturer; every used unit is inspected and functionally verified in-house at our 20,000 sq ft secure facility in Elgin, Illinois before it ships. Our Test Architects can help you select the condition, calibration, and configuration that fit your application.

**Please review the Manufacturer's Data Sheet to verify published specifications. Feedback on this webpage is always welcome — please reach out to your Test Architect at any time for questions or concerns. Thank you, we truly appreciate you being our customer.**

## Details

- **Price:** 0.0 USD
- **Vendor:** Stanford Research Systems
- **Type:** Spec An
- **Tags:** Analyzers, Manufacturers, product_manual_group_1, Product_used, Spectrum, Stanford Research, Updated Item Review

## Variants

| Variant | Price | Available |
|---------|-------|-----------|
| None | 0.00 USD | In stock |
| NIST Traceable | 0.00 USD | In stock |
| NIST Traceable with Full Data | 0.00 USD | In stock |
| ISO IEC 17025 Accredited | 0.00 USD | In stock |

## Images

- SR770 Stanford Research Spectrum Analyzer

---

> Source: [ValueTronics](https://valuetronics.com/products/sr770-stanford-research-spectrum-analyzer-used)
> Updated: 2026-06-27
