# Agilent 4288A 1 kHz/1 MHz Capacitance Meter (Pre-Owned)

# Agilent 4288A 1 kHz/1 MHz Capacitance Meter (Pre-Owned)

## Key Features At A Glance

-   Dual test frequencies of 1 kHz and 1 MHz for compliance with IEC 60384 and JIS C5101 capacitor sorting standards
-   Basic measurement accuracy of ±0.07% for capacitance and ±0.0005 for dissipation factor with 6-digit display resolution
-   Selectable measurement times: 6.5 ms short mode and 16.5 ms long mode for high-throughput production sorting
-   Test signal levels selectable from 0.1 V to 1.0 V rms in 0.1 V steps with ±5% level accuracy across the capacitance range
-   Four-terminal pair measurement configuration with open/short/load/offset compensation functions
-   9-bin comparator with auxiliary and out-of-bins sorting, plus pass/fail decisions for D, Q, G, Rs, or Rp
-   Standard GPIB (SCPI), optically-isolated handler, and 64-channel scanner interfaces with multi-channel compensation
-   Selectable 1 MHz frequency shift (-1%, +1%, +2%) to prevent test signal interference in multi-instrument array systems

The Agilent 4288A 1 kHz/1 MHz Capacitance Meter is a high-speed capacitance measurement instrument designed for ceramic capacitor production testing. The datasheet positions the 4288A as a measurement solution combining 1 kHz and 1 MHz test frequencies, basic capacitance accuracy of ±0.07%, dissipation factor accuracy of ±0.0005, and selectable short-mode (6.5 ms) and long-mode (16.5 ms) measurement times. The instrument measures Cp, Cs, D, Q, G, Rs, and Rp parameters through a four-terminal pair configuration.

The datasheet identifies four production-test application areas for the 4288A: accelerating sorting test throughput on production lines, upgrading measurement-data accuracy for production process control, improving the efficiency and reliability of shipping inspection, and enhancing efficiency of high-volume capacitor incoming inspection. The 1 MHz frequency covers low-value capacitors from 1 pF to 1.5 nF, while the 1 kHz frequency covers medium- to high-value capacitors from 100 pF up to 20 µF, enabling sorting tests in compliance with the IEC 60384 and JIS C5101 standards named in the datasheet.

ValueTronics has supported the test and measurement community since 1992, operating from a 20,000 square foot secure warehouse at 1675 Cambridge Drive in Elgin, Illinois. Every instrument we list passes through our facility for inspection and performance verification by our in-house technicians before shipping. This direct ownership of the inspection workflow — rather than drop-shipping from third-party sources — is what allows us to stand behind the condition grades we publish and the warranty terms we offer on each {{CONDITION}} unit.

## Brand Heritage

The 4288A carries the Agilent Technologies brand, which originated when Hewlett-Packard spun off its test and measurement division as Agilent in 1999. In 2014, Agilent's electronic measurement business was transferred to Keysight Technologies, which is the current corporate home for the legacy HP and Agilent test and measurement product lines.

## Accessories Supplied

-   Power cable

## Product Core & Specifications

Specification

Value

Measurement Parameters

Parameters

Cp, Cs, D, Q, G, Rs, Rp

Parameter combinations

Cp-D, Cp-Q, Cp-G, Cp-Rp, Cs-D, Cs-Q, Cs-Rs

Cs, Cp display range (1 kHz)

0.00001 pF to 20.0000 µF

Cs, Cp display range (1 MHz)

0.00001 pF to 1.50000 nF

D display range

0.00001 to 9.99999

Q display range

0.1 to 99999.9

Rs, Rp display range

0.01 mΩ to 999.999 MΩ

G display range

0.00001 µS to 9.99999 kS

Δ% display range

\-999.999% to +999.999%

Measurement Range

Capacitance range at 1 kHz

100 pF to 10 µF, 16 ranges (over range 150%, 200% at 10 µF)

Capacitance range at 1 MHz

1 pF to 1 nF, 10 ranges (over range 150%)

Measurement Accuracy

Basic C accuracy (long mode)

±0.07%

Basic D accuracy (long mode)

±0.0005

C accuracy (short mode)

±0.085%

D accuracy (short mode)

±0.00065

Measurement Functions

Test frequency

1 kHz (±0.01%), 1 MHz (±0.01%)

Frequency shift

1 MHz can be varied to 990 kHz, 1.01 MHz or 1.02 MHz

Test signal level

0.1 V to 1.0 V rms in 0.1 V rms steps

Test signal level accuracy

±5% @ all C ranges

Source impedance (220 nF to 10 µF @ 1 kHz)

1 Ω (nominal)

Source impedance (100 pF to 100 nF @ 1 kHz)

20 Ω (nominal)

Source impedance (1 pF to 1 nF @ 1 MHz)

20 Ω (nominal)

Measurement terminals

Four-terminal pair

Ranging

Auto and manual

Display digits

Selectable from 4, 5 and 6 digits

Deviation measurement

Deviation and percent deviation from a reference

Measurement time mode

Short and long

Averaging

1 to 256

Trigger mode

Internal, external, manual and GPIB

Delay time

Programmable 0 to 1000 ms in 1 ms steps

Cable length

0 m, 1 m and 2 m

Measurement Time

Short mode

6.5 ms ±0.5 (T1=4.5, T2=2)

Long mode

16.5 ms ±1 (T1=14.5, T2=2)

Compensation

Open/short compensation

Stray C and residual L: No limits; Residual G: ≤ 20 µS; Residual R: ≤ 20 Ω

Load compensation

Valid at selected frequency only

Offset compensation

Subtracts desired compensation values from measured values

Scanner multi-compensation

Open/short/load compensation for up to 64 channels

Comparator

Bins

9 bins and out of bins for C; Pass/fail decision for D, Q, G, Rs and Rp

Status outputs

AUX, P-Hi, P-Lo, S-Reject, Low C Reject

Limit setting

Absolute value, deviation and % deviation

Bin count

0 to 999999

Circuit Protection

Max withstanding discharge voltage (typical)

√(2/C) V and ≤ 1000 V

Memory and Setup

Resume function memory period (typical)

72 hours @ 23 °C ±5 °C

Save/Recall

10 instrument setups in non-volatile memory

Interfaces

GPIB

Complies with IEEE-488.1 and 488.2; SCPI programming language

Data buffer

Up to 1000 sets of measured values and comparator decision results

Handler interface

Negative true logic, optically-isolated open collector signals

Handler output signals

Bin 1 to 9, out of bins, aux bin, P-Hi, P-Lo, S-reject, Low C, index, EOM, Ready for Trigger, Overload, Alarm

Handler input signals

External trigger and keylock

Scanner interface

Open/short/load compensation for up to 64 channels

Scanner output signals

Index and EOM

Scanner input signals

CH0 to CH5 (channel identification), external trigger, CH VALID

Supplemental Data (Typical)

Test signal voltage resolution

1 mV rms

Voltage monitor accuracy

±(3% of reading + 1 mV)

Measurement stability C (long mode)

≤ 0.005% / 24 hours

Measurement stability D (long mode)

≤ 0.00005 / 24 hours

Temperature coefficient C

≤ 0.001% / °C

Temperature coefficient D

≤ 0.00001 / °C

Settling time (frequency)

10 ms

Settling time (test signal level)

10 ms

General

Power requirement

90 V to 132 V, 198 V to 264 V ac, 47 Hz to 66 Hz, 35 W/100 VA max

Operating temperature

0 °C to 45 °C

Operating humidity

15% to 95% RH @ ≤ 40 °C, no condensation

Dimensions

320 mm (W) × 100 mm (H) × 300 mm (D) (12.6 in × 3.9 in × 11.8 in)

Weight

Approximately 3 kg (6.6 lbs)

**Important:** Maximum withstanding discharge voltage (typical): √(2/C) volts and ≤1000 V, where C is the capacitance value of the measured device. Discharge test device before connecting to the UNKNOWN terminals.**Important:** Test fixtures are not furnished as standard with the 4288A. The appropriate test fixture and/or test leads must be ordered separately to match the device-under-test geometry (SMD, axial lead, array-type, etc.) — see Ordering Information.**Important:** The operation manual is not furnished as standard. One of the language options (4288A-ABA U.S. English or 4288A-ABJ Japanese) must be specified for the manual to ship with the product.**Important:** For test fixtures 16043B, 16044A, and 16047E, a language option (ABA or ABJ) must be specified for the operation manual to ship with the product.**Important:** The Rack flange handle kit is not compatible with the 4288A.**Important:** Basic accuracy specifications apply to the measurement time long mode.**Important:** Measurement accuracy is guaranteed at the unknown terminals when: warm-up time ≥ 10 min, ambient temperature 23 °C ±5 °C, cable length 0 m, 1 m or 2 m (16048A/B/D), open compensation performed, and measured D value Dx ≤ 0.1.Recommended pairing: select the test fixture matched to the component form factor — 16044A for 4-terminal SMD measurements, 16034G for small 2-terminal SMD (down to 0.6 × 0.3 mm), 16034H for array-type SMD components, or 16334A tweezer fixture for ad-hoc SMD probing. Pair the chosen fixture with a 16048A, 16048B, or 16048D four-terminal pair test lead as listed in the datasheet.

## About this used unit

-   Warranty included
-   Functional verification included
-   Standard Calibration Upgrade Options: No Calibration Required, NIST Traceable, Z540.1 or ISO 17025 with Data, Z540.3 Guardbanding with Data.
-   Note that unnecessary accessories may not be included (contact Test Architect to confirm).

**Please review the Manufacturer's Data Sheet to verify published specifications. Feedback on this webpage is always welcome — please reach out to your Test Architect at any time for questions or concerns. Thank you, we truly appreciate you being our customer.**

## Details

- **Price:** 0.0 USD
- **Vendor:** Agilent
- **Type:** Lcr Meter
- **Tags:** Agilent, Agilent Keysight, Capacitance, Manufacturers, Meters & DAQ, product_manual_group_1, Product_used

## Variants

| Variant | Price | Available |
|---------|-------|-----------|
| None | 0.00 USD | In stock |
| NIST Traceable | 0.00 USD | In stock |
| NIST Traceable with Full Data | 0.00 USD | In stock |
| ISO IEC 17025 Accredited | 0.00 USD | In stock |

## Images

- 4288A Agilent Capacitance Meter

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> Source: [ValueTronics](https://valuetronics.com/products/4288a-agilent-capacitance-meter-used)
> Updated: 2026-05-30